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gpio: cleanup test code

This commit is contained in:
Karan Misra 2014-04-06 04:05:18 +05:30
parent 5b852d9f42
commit 2172e9384c

View File

@ -43,13 +43,13 @@ func newFakeDigitalPin(n int) DigitalPin {
}
func TestGpioDriverDigitalPin(t *testing.T) {
var tests = []struct {
tests := []struct {
key interface{}
n int
}{
{1, 1},
}
var pinMap = PinMap{
pinMap := PinMap{
&PinDesc{ID: "P1_1", Aliases: []string{"1"}, Caps: CapDigital, DigitalLogical: 1},
}
driver := newGPIODriver(pinMap, newFakeDigitalPin, nil, nil)
@ -90,13 +90,13 @@ func newFakeAnalogPin(n int) AnalogPin {
}
func TestGpioDriverAnalogPin(t *testing.T) {
var tests = []struct {
tests := []struct {
key interface{}
n int
}{
{1, 1},
}
var pinMap = PinMap{
pinMap := PinMap{
&PinDesc{ID: "P1_1", Aliases: []string{"1"}, Caps: CapAnalog, AnalogLogical: 1},
}
driver := newGPIODriver(pinMap, nil, newFakeAnalogPin, nil)
@ -113,7 +113,7 @@ func TestGpioDriverAnalogPin(t *testing.T) {
}
func TestGpioDriverUnavailablePinType(t *testing.T) {
var pinMap = PinMap{
pinMap := PinMap{
&PinDesc{ID: "P1_1", Aliases: []string{"1"}, Caps: CapDigital, DigitalLogical: 1},
&PinDesc{ID: "P1_2", Aliases: []string{"1"}, Caps: CapAnalog, AnalogLogical: 1},
}